A probe station is a precision system used to test semiconductor wafers and devices. It positions tiny probes onto wafer pads or circuits, allowing engineers to measure electrical, RF, or optical performance before packaging.

- Manual: Operator-controlled, best for R&D and low-volume testing.
- Semi-automatic: Motorized movement, higher accuracy, suitable for mid-volume production.
- Fully automatic: Complete automation, ideal for high-volume wafer testing in fabs.

Select based on your wafer size, application type, and test requirements. For example, R&D often uses 4–6", while advanced production requires 8–12" wafer probe stations.

Probe stations are used in:
- Wafer-level device characterization
- Failure analysis and debugging
- High-frequency RF testing
- Optical and MEMS device evaluation

Temperature-controlled chucks allow wafers to be tested under different thermal conditions. This simulates real-world environments and ensures device reliability across operating ranges.

Calibration is typically recommended every 6–12 months, depending on usage. Regular maintenance ensures accuracy, prevents downtime, and extends equipment life.

Frequent issues include:
- Probe tip wear (replace or resharpen)
- Alignment errors (recalibrate stage)
- Vacuum chuck leaks (inspect seals)
- Electronic noise (check grounding and shielding)

Yes. A professionally refurbished probe station, with OEM parts and calibration, can deliver performance comparable to new equipment—at a significantly lower cost.

With proper care, probe stations often last 10–15 years. Many labs extend lifespan further through refurbishment and upgrades.

Keep probes clean, avoid excessive pressure, and use proper alignment. Regular cleaning with approved solvents prevents contamination and damage.

High-frequency tests often require:
- RF/microwave probes
- Low-loss coaxial cables
- Impedance-matched probe cards
- Shielded enclosures

Choose based on:
- Device type (digital, analog, RF, MEMS)
- Pin count and pitch
- Current and voltage requirements
- Testing speed and environment

- DC probes: For low-frequency electrical testing
- RF probes: For high-frequency device characterization up to GHz ranges
- Microwave probes: For very high-frequency applications (mmWave, 5G, satellite)

- Vacuum chucks: Hold wafers securely during probing
- Magnetic chucks: For substrates with magnetic properties
- Thermal chucks: Provide heating/cooling for temperature-dependent testing

Replacement parts can be sourced from specialized semiconductor equipment suppliers, refurbishment companies, or OEM distributors. Working with certified vendors ensures compatibility and reliability.

- New probe stations: $200,000–$800,000 depending on automation level
- Refurbished systems: $50,000–$200,000, offering excellent ROI for labs and fabs

Key factors include: wafer size capacity, automation level, probe type, accessories, and whether the unit is new or refurbished.

Inspect stage accuracy, chuck condition, probe arms, control software, and verify calibration records. Always request a demo test if possible.

Yes, if purchased from a reputable supplier with proven refurbishment processes, warranty, and after-sales support. Always check customer references and service capabilities.

- Buy refurbished parts when possible
- Schedule preventive maintenance
- Train operators to avoid damage
- Use compatible third-party probes and accessories