Product Overview: ZYGO 7702
The ZYGO 7702 is a state-of-the-art interferometric metrology system tailored for advanced surface profiling and dimensional measurements. It is engineered to deliver unparalleled precision and efficiency, making it a go-to solution for wafer inspection, mask metrology, and a wide range of other applications.
Key highlights include:
- ・Advanced interferometry for sub-nanometer measurement accuracy.
- ・Robust design optimized for both laboratory and production environments.
- ・Flexible configurations to address specific industry requirements.
Technical Specifications
Below are the core technical parameters of the ZYGO 7702:
| Parameter | Specification |
|---|---|
| Measurement Accuracy | Sub-nanometer |
| Measurement Range | Up to 10 mm |
| System Dimensions | 600 mm x 400 mm x 300 mm |
| Weight | 5.5 kg |
| Interferometric Technology | Phase-shifting interferometry |
| Data Acquisition Speed | Up to 1 kHz |
| Compatible Materials | Silicon, glass, ceramics, and metals |
These technical capabilities ensure the system meets rigorous industry demands while offering flexibility across material types.
Key Features and Functional Highlights
The ZYGO 7702 stands out with several unique features:
1. High-Resolution Interferometry
Equipped with a patented interferometric engine, the ZYGO 7702 achieves sub-nanometer accuracy for surface height measurements, ensuring optimal performance for demanding applications.
2. Real-Time Surface Profiling
With high-speed data acquisition, the system provides real-time feedback, enabling swift decision-making during production processes.
3. Advanced Software Integration
The user-friendly interface integrates seamlessly with ZYGO’s proprietary MetroPro® software, offering a suite of analytical tools for comprehensive data interpretation.
4. Automation-Ready Design
The system supports full automation, including robotic wafer handling, making it ideal for high-throughput production environments.
Applications and Industries
The ZYGO 7702 is versatile, catering to multiple industries:
| Industry | Application |
|---|---|
| Semiconductor | Wafer and mask inspection, overlay measurements |
| Optics Manufacturing | Lens surface profiling, thin-film thickness |
| Precision Engineering | Component alignment, defect detection |
| Nanotechnology | Nanoscale fabrication quality assurance |
This adaptability ensures the ZYGO 7702 remains a critical tool across various domains requiring precise metrology.
Competitive Advantages
The ZYGO 7702 outperforms its competitors in several key areas:
- 1. Superior Accuracy: Leveraging advanced interferometric techniques, it achieves higher precision than competing systems.
- 2. Enhanced Throughput: The system's fast data acquisition reduces inspection cycle times, maximizing production efficiency.
- 3. Customizability: Modular configurations allow users to adapt the system for specific tasks, providing unmatched versatility.
- 4. Durability and Reliability: Built with robust materials, the ZYGO 7702 is optimized for long-term performance in challenging environments.
Conclusion
The ZYGO 7702 represents a cutting-edge solution for high-precision metrology needs, setting new benchmarks in accuracy, speed, and adaptability. With its advanced features and robust performance, it is an invaluable tool for decision-makers seeking to optimize production quality and efficiency.
To learn more about the ZYGO 7702, contact our technical support team or sales representatives today. Explore detailed technical documentation and request a product demonstration by visiting our website. Let the ZYGO 7702 transform your metrology processes and drive your success in the semiconductor industry!
